DUAL BEAM

The FEI Quanta™ family includes six variable-pressure and environmental scanning electron microscopes (ESEM™) and two DualBeam™ systems, all of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.

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Imaging, analysis and control of matter at the nanoscale—keys to future research and development—are routine with the Helios NanoLab™. FEI's newest DualBeam™ combines the most advanced scanning electron microscope (SEM) and focused ion beam (FIB) technologies with innovative gas chemistries, detectors and manipulators. With unsurpassed SEM resolution, image quality and stunning Sidewinder™ FIB performance, imaging, milling or preparing samples is fast and easy for semiconductor and data storage labs, as well as industries and researchers facing today's most challenging applications.

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